Events

Join us for this 2-part webinar! Each webinar may be viewed independently. Remember to register for both!

• Wednesday 18 December: the Presentation
• Thursday 19 December: the Demonstration (LIVE!)

All modern scanning/transmission electron microscopy (S/TEM) instruments can operate in both conventional (TEM) and scanning (STEM) modes.  However, STEM mode has now arguably eclipsed TEM mode in terms of utility, breadth of applications, and scientific and technological importance.  This paradigm shift in S/TEM (aka the STEM “revolution”) began circa 2000, when high-angle annular dark-field (HAADF) STEM imaging was shown to overcome many of the inherent challenges and limitations of conventional high-resolution (aka “lattice”) TEM imaging and reveal insights into the atomic-scale structure of materials that were previously unattainable.  Concomitant with this increasing interest, S/TEM instrument manufacturers placed greater emphasis on improving STEM functionality while the presence and accessibility of commercially available C_s probe correctors enabling pico-scale STEM probes became more ubiquitous.  

Today, over two decades after the STEM revolution began, HAADF-STEM imaging (with or without C_s correction) is now arguably the most widely used atomic-scale S/TEM imaging technique but is only the “tip of the iceberg” of what modern STEM imaging offers.  Thus, a review of the different STEM techniques is needed, with this 2-part webinar offering both a presentation and a demonstration (LIVE!) to specifically address the following:

• Brief historical review of STEM imaging and the STEM revolution
• Technical discussion of different STEM imaging techniques
• Importance and contribution of each STEM technique to the STEM revolution
• The current course and direction of the STEM revolution

---

About the Speaker

Nicholas G. Rudawski, PhD joined the Research Service Centers at the University of Florida in 2012 as a service/teaching faculty in the Herbert Wertheim College of Engineering where he is the primary staff member overseeing training, maintenance, and operation of three S/TEMs, two dual FIB/SEMs, and one SEM.

A prolific publisher of research, he has used his electron microscopy skills to author/coauthor over 60 peer-reviewed publications including contributions to Nature Electronics, Physical Review Letters, Materials and Engineering R: Reports, Applied Physics Letters, Journal of Power Sources, ACS Applied Materials & Interfaces, and many others. Additionally, he has contributed over 30 conference presentations, 5 book chapters, and 1 patent.

Dr. Rudawski lives in Gainesville, FL with his wife, Erica, (who is very supportive and even tolerant of his electron microscopy obsession) and his children, Avery (daughter), Me-lo (cat), and Plummie (dog). When he is not working on something electron microscopy-related, he enjoys spending time with his family, lifting heavy things, making noise with his electric guitars, and watching The Simpsons.