Mouad Essani — University of Paris Est Creteil
A simple and accurate approach for thickness measurement of particles and thin films using SEM-EDS
Victoria Pappas —Northwestern University
Optimizing a Pipeline for Eukaryotic Ultrastructure
Lolita Rotkina — Donald Danforth Plant Science Center
High-Resolution Volume Electron Microscopy of an Entire Epidermal Plant Cell Using Plasma-Focused Ion Beam Scanning Electron Microscopy
Pengyuan Xiu — Intel Corporation
Achieving 0.002° Measurement Precision of Sample Surface Tilt by Utilizing FIB-SEM Coincidence