Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience
Authors: Jian Min Zuo and John C.H. Spence
Resource Link: https://doi.org/10.1007/978-1-4939-6607-3
Tags: transmission electron microscopy, TEM, imaging, diffraction, nanoscience,Crystal Structure Refinement, Electron Diffraction Geometry, Electron Diffraction Theory, Electron Nanodiffraction, Large Angle Methods and Defects, Precession Electron Diffraction, Scanning Electron Diffraction, Single Crystal CBED Patterns, Ultrafast Electron Diffraction