Events

Join Microscopy Today Presents and its spotlight on TESCAN for an enlightening webinar on the transformative capabilities of the TESCAN SEM/FIB-SEM Expert PI.

Discover how this advanced software tool can revolutionize your daily challenges, offering unmatched utility and enabling the benefits of automation for everyone—from non-programmers to scripting experts.

Register Now!
Don’t miss this opportunity to enhance your automation and scripting capabilities. To secure your spot in this informative webinar, register now:

9:00 CET – EU and Asia

https://us06web.zoom.us/meeting/register/tZ0of-2vqzsqG9DplrcU9LcccnYnDe4CESG8

14:00 ET – North & South America

https://us06web.zoom.us/meeting/register/tZctd-itrzwqHdZBw-M-jS7_6Dq4xj0ePE66

What You’ll Learn
In this webinar, we will delve into the features and applications of the TESCAN SEM/FIB-SEM Expert PI software module, highlighting its impact on Nanoprototyping.

• Introduction to Automation and Scripting: Explore the basics of tool automation and its importance in streamlining of everyday workflows.
• Reduced Downtime & Streamlined Workflows: Learn how SEM/FIB-SEM Expert PI’s Python command library minimizes downtime and streamlines workflows by allowing the users to develop customized automation procedures.
• Specialized imaging and FIB milling routines: Create these routines even as a non-programmer using TESCAN VisualCoder - an intuitive programming environment for efficient recipe development.
• Advanced Applications: See real-world examples of how SEM/FIB-SEM Expert PI helps create custom SEM and FIB patterning strategies, such as helical objects for plasmonic research, by taking direct control of the patterning engine through the scripting interface.
• Maximize your project’s potential: Connect with the open-access scientific community and fully utilize the extensive Python script libraries.

Speaker

Milos Hrabovsky is a Product Marketing Manager for Nanoprototyping at TESCAN GROUP, Brno, Czech Republic, focusing on electron and ion beam patterning, depositions and enhanced etching, and automation of microscopes with the use of scripting. His previous position as R&D Application Specialist for electron beam lithography and focused ion beam patterning provided him with substantial knowledge of electron and ion beam microscopy, its applications and its overall benefits for the large variety of nanofabrication tasks.

Hrabovsky received his master’s degree in applied physics in 2014.  During his PhD studies, he joined Tescan as an application developer for electron and ion beam patterning. In 2017 he left his PhD in applied physics to focus solely on work in the field of electron and ion beam microscopy.

Why You Should Attend
Gain critical insights into how TESCAN SEM/FIB-SEM Expert PI can enhance your microscope workflow, minimizing downtime and maximizing efficiency. Register now to stay ahead in the field of sample analysis and preparation, and nanoprototyping.