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Microscopy Today Presents - 4D-STEM Application for Beam-Sensitive Polymers
- Price: FREE
Register:
This webinar is organised in collaboration with the University of Leeds and TESCAN, a global innovator in electron microscopy solutions for materials science, semiconductors, and life sciences.
- 9:00 CET – Europe and Asia: https://us06web.zoom.us/meeting/register/FW6bLuFTRqq_R6Hw8mUAaA
- 11:00 ET – Europe, North & South America: https://us06web.zoom.us/meeting/register/08IQRgAcS5m9zmstL1XEKA
BE SURE YOU REGISTER FOR YOUR CHOSEN TIME!
Microscopy Today presents a spotlight on TESCAN and the University of Leeds for an enlightening webinar. Join Prof. Andy Brown and TESCAN’s Daniel Nemeček to explore low-dose 4D-STEM techniques for radiation-sensitive materials.
Professor Andy Brown, University of Leeds will present new methods for structural analysis of beam-sensitive polymers using low-dose 4D-STEM techniques. His research demonstrates how the molecular integrity can be preserved while acquiring nanodiff raction datasets using fast beam blanking and direct electron detection. Prof. Brown will co-host with Daniel Nemeček, TESCAN.
This webinar session:
- Highlights how academia and industry are advancing analytical STEM for real-world materials.
- Explores the full potential of 4D-STEM applications for beam-sensitive polymers
Don’t miss your chance to explore the full potential with 4D-STEM Application for Beam-Sensitive Polymers.
Start Date & Time
Thu, Aug 28, 2025,
End Date & Time
Thu, Aug 28, 2025,
Location
Zoom