About ACEM-FIG
The Aberration Corrected Electron Microscopy Focus Interest Group (ACEM-FIG) is a community of MSA members with a common interest in applying aberration corrected electron microscopy with other developing technologies to study functional materials. Our goal is to provide a platform to discuss new ideas/work and to help students and early-career researchers keep up to date with new advancements in technologies within the relevant field. Our activities include a biennial pre-meeting congress (PMC, invited speakers with optional poster session), FIG-sponsored symposia (invited and contributed talks/posters), and a business meeting during the annual M&M meeting (normally with a meal). We may also help organize webinars on relevant topics virtually to benefit more members.
Officers:
FIG Leader: Shize Yang, Yale University
FIG Leader-Elect: David Bell, Harvard University
Treasurer: Matthew Boebinger, Oak Ridge National Laboratory
Become a Member
Annual dues are $15.00 USD and can be paid alongside MSA membership upon joining the society or via the FIG Store for subsequent renewals. You may also contact the FIG leader with questions.
If you are an ACEM-FIG member, or sign up at the MSA Member Portal (FIG Store), please plan to join us at our business meeting at the Microscopy & Microanalysis (M&M) Annual Meeting to find out more about upcoming activities and how to participate.
Events
- M&M 2027, PMC *in planning*
- M&M 2026, Symposium
- Recent Developments in Hardware, Accessories, and Software Tools
- M&M 2024, Symposium
- Electron Microscopy of Advanced Functional Materials
- M&M 2023, PMC
- Hardware and Software Developments in Electron Microscopy