MT Micrograph 2021 Award Finalist | A pedicellaria is a three-jawed defensive appendage found in sea urchins, sea stars, and some other echinoderms. Pseudo-colored secondary electron SEM image at 15 kV. Submitted by Kenneth Bart, Hamilton College, New York

Aberration Corrected EM (ACEM) FIG

MT Micrograph 2021 Award Finalist | A pedicellaria is a three-jawed defensive appendage found in sea urchins, sea stars, and some other echinoderms. Pseudo-colored secondary electron SEM image at 15 kV. Submitted by Kenneth Bart, Hamilton College, New York

About ACEM-FIG

The Aberration Corrected Electron Microscopy Focus Interest Group (ACEM-FIG) is a community of MSA members with a common interest in applying aberration corrected electron microscopy with other developing technologies to study functional materials. Our goal is to provide a platform to discuss new ideas/work and to help students and early-career researchers keep up to date with new advancements in technologies within the relevant field. Our activities include a biennial pre-meeting congress (PMC, invited speakers with optional poster session), FIG-sponsored symposia (invited and contributed talks/posters), and a business meeting during the annual M&M meeting (normally with a meal). We may also help organize webinars on relevant topics virtually to benefit more members.

Officers:

FIG Leader: Shize Yang, Yale University
FIG Leader-Elect: David Bell, Harvard University
Treasurer: Matthew Boebinger, Oak Ridge National Laboratory

Become a Member

Annual dues are $15.00 USD and can be paid at membership renewal or when you join the Society. See https://www.microscopy.org/ for more information. You may also contact the FIG leader with questions.

If you are an ACEM-FIG member, or sign up at the MSA Member Portal (FIG Store), please plan to join us at our business meeting at the Microscopy & Microanalysis (M&M) Annual Meeting to find out more about upcoming activities and how to participate.

Events

  • M&M 2027, PMC *in planning*
  • M&M 2026, Symposium
    • Recent Developments in Hardware, Accessories, and Software Tools
  • M&M 2024, Symposium
    • Electron Microscopy of Advanced Functional Materials
  • M&M 2023, PMC
    • Hardware and Software Developments in Electron Microscopy