Vendor Tutorials

Company Booth Title Date
3D-Micromac AG 816 Laser-Based Sample Preparation for Microstructure Diagnostics with microPREP Monday, Aug 5, 2019
Anton Paar USA 910 Surface Characterization with Anton Paar Monday, Aug 5, 2019
Applied Beams LLC 952 CaesiumXL: new life for your FEI XL-series SEM Monday, Aug 5, 2019
Clark-MXR, Inc. 1204 Nano- to micro scale fabrication with femtosecond lasers Monday, Aug 5, 2019
COXEM Co. Ltd. 744 New High Speed SEM Auto-Focus and Auto-B/C with the EM-30 NEXT Monday, Aug 5, 2019
DigiM Solution LLC 1254 Cloud image processing with data management, AI, and image-based simulation Monday, Aug 5, 2019
Direct Electron 518 Advancements in Materials Science Enabled by Direct Detection Cameras Monday, Aug 5, 2019
Electron Microscopy Sciences /Lattice Gear 938 Preparing Surfaces and Cross Sections for Analysis using Dry, Clean and Touchless Methods Monday, Aug 5, 2019
Electron Microscopy Sciences/Latticegear 938 Surface & Cross Section prep for Analysis Monday, Aug 5, 2019
EMCN/ MA-tek T452 K-kit Meets All Needs for Liquid TEM Monday, Aug 5, 2019
Gatan 928 4D STEM Diffraction Imaging: An Introduction to Data Acquisition and Processing Monday, Aug 5, 2019
Henan Zhongjingkeyi Technology Co./ MA-Tek Inc. T452 K-kit Meets All Needs for Liquid TEM Monday, Aug 5, 2019
JASCO Inc 1054 Raman Imaging Monday, Aug 5, 2019
MIPAR Image Analysis 1154 Alternatives to EBSD for Grain Analysis Monday, Aug 5, 2019
NenoVision 750 AFM-in-SEM: Discover advantages and unique features of correlative imaging Monday, Aug 5, 2019
point electronic GmbH 549 Improved BSE workflow and quantitative analysis with the new COMPPASS detector Monday, Aug 5, 2019
Quantum Design Inc. 822 Correlative In-Situ Analysis of Nanostructured Materials by Combination of AFM, SEM, and FIB" Monday, Aug 5, 2019
RMC Boeckeler 828 The PTFL: A fluorescence ultramicrotome for correlative imaging. Monday, Aug 5, 2019
Ted Pella Inc 1338 Processing for Light and Electron Microscopy Immunohistochemistry Using the PELCO BioWave Monday, Aug 5, 2019
TMC 422 Installing Active Vibration Isolation for SEMs, upgrading firmware and monitoring performance Monday, Aug 5, 2019
TTP Labtech 1147 Introducing chameleon – next generation sample preparation for single particle Cryo-EM Monday, Aug 5, 2019
Vibration Engineering Consultants 1642 The Importance of the Site Survey: What it Reveals, How to Interpret the Data and Why You Should Work with an Independent Provider Monday, Aug 5, 2019
Vitatech Electromagnetics 712 ACS and Passive Shielding Integration Monday, Aug 5, 2019
Digital Surf 1352 Apply color to SEM images quickly and easily Monday, Aug 5, 2019
Physical Electronics 812 The Complimentary Nature of Surface Analysis Techniques (AES/XPS/TOF-SIMS) to Microscopy Monday, Aug 5, 2019
SEMTech Solutions, Inc. 530 Converting Used SEMs to Win10 Capable Systems Monday, Aug 5, 2019
SEMTech Solutions, Inc. 530 BSE Imaging Demonstration on a XL30 ESEM Monday, Aug 5, 2019
3D-Micromac AG 816 Laser-Based Sample Preparation for Microstructure Diagnostics with microPREP Tuesday, Aug. 6, 2019
Agilent Technologies- iLab Solutions 1651 Implementing a Core Facility Management System Leaves Time for Science Tuesday, Aug. 6, 2019
Anton Paar USA 910 Surface Characterization with Anton Paar Tuesday, Aug. 6, 2019
Applied Beams LLC 952 CaesiumXL: new life for your FEI XL-series SEM Tuesday, Aug. 6, 2019
Bruker 638 An alternative method for ultrafast EBSD mapping Tuesday, Aug. 6, 2019
Bruker 638 EDS Quantification of electron transparent samples in TEM and T-SEM Tuesday, Aug. 6, 2019
DigiM Solution LLC 1254 Cloud image processing with data management, AI, and image-based simulation Tuesday, Aug. 6, 2019
Digital Surf 1352 Particle analysis and classification Tuesday, Aug. 6, 2019
Direct Electron 518 Applications of 4D STEM in Materials Science Tuesday, Aug. 6, 2019
E.A. Fischione Instruments, Inc. 846 Optimal TEM specimen preparation post-FIB milling: PicoMill® TEM specimen preparation system Tuesday, Aug. 6, 2019
EMCN/ MA-tek T452 K-kit Meets All Needs for Liquid TEM Tuesday, Aug. 6, 2019
Ephemeron Labs 1447 Quantitative EBIC and current based imaging Tuesday, Aug. 6, 2019
Fluid Imaging Technologies 448 Introduction to Flow Imaging Microscopy - Rapid Particle Characterization and Enumeration in a Fluid Stream Tuesday, Aug. 6, 2019
Gatan 928 Advanced EELS Analysis: Spectral Fitting, PCA and Standards Based Quantification Tuesday, Aug. 6, 2019
Henan Zhongjingkeyi Technology Co./ MA-Tek Inc. T452 K-kit Meets All Needs for Liquid TEM Tuesday, Aug. 6, 2019
Hitachi High Technologies America 1438 Modern SEM-based STEM Imaging and Tips Tuesday, Aug. 6, 2019
HREM Research Inc. 537 Rigid/non-rigid distortion correction Tuesday, Aug. 6, 2019
Hummingbird Scientific 1045 In-situ TEM biasing of different sample geometries at elevated or cooled temperatures Tuesday, Aug. 6, 2019
ibidi USA, Inc. 438 Intro to ibidi Stagetop Incubator Tuesday, Aug. 6, 2019
ibss Group, Inc. 1552 SEM Hydrocarbon Mitigation Tuesday, Aug. 6, 2019
IDES, Inc. 1451 Electrostatic Subframing, Compressive Sensing, and Kilohertz TEM Video Tuesday, Aug. 6, 2019
JASCO 1054 Infrared Microscopy Tuesday, Aug. 6, 2019
JEOL USA, Inc 623 4D STEM with the pixelated STEM detector "4D Canvas" Tuesday, Aug. 6, 2019
Leica Microsystems 538 Presentation and Hands-on Session: EM ICE High Pressure Freezing system: Unique offerings by Leica Microsystems Tuesday, Aug. 6, 2019
Linkam Scientific Instruments 551 Tools for Cryo Correlative Microscopy Tuesday, Aug. 6, 2019
Microscopy Innovations 1049 Next-generation Automated Biological Specimen Prep for TEM Tuesday, Aug. 6, 2019
MIPAR Image Analysis 1154 Challenging Micrograph Analysis: The Latest in Computer Vision Tuesday, Aug. 6, 2019
NenoVision 750 AFM-in-SEM: Discover advantages and unique features of correlative imaging Tuesday, Aug. 6, 2019
Nion Co. 1102 Latest Developments with Nion Microscopes Tuesday, Aug. 6, 2019
Object Research Systems 937 How Deep Learning Actually Works: Understanding this huge leap in imaging science Tuesday, Aug. 6, 2019
Physical Electronics 812 Using AES, EDS, and FIB to Detect, Identify, and Image Buried Metallic Particles Tuesday, Aug. 6, 2019
point electronic GmbH 549 How to measure height in SEM with BSE topography Tuesday, Aug. 6, 2019
Protochips 644 In Situ TEM: Creating more realistic experimental environments for materials research by precisely controlling the introduction of humidity Tuesday, Aug. 6, 2019
Quantum Design Inc. 822 Correlative In-Situ Analysis of Nanostructured Materials by Combination of AFM, SEM, and FIB" Tuesday, Aug. 6, 2019
SEMTech Solutions, Inc. 530 Converting Used SEMs to Win10 Capable Systems Tuesday, Aug. 6, 2019
SEMTech Solutions, Inc. 530 BSE Imaging Demonstration on a XL30 ESEM Tuesday, Aug. 6, 2019
Technex Lab Co., Ltd. 443 How good are the Permanent Magnetic Lenses for the electron microscopy? Tuesday, Aug. 6, 2019
Thermo Fisher Scientific 1038 AquilosTM cryo-FIB - the leading platform for cryo-tomography sample preparation Tuesday, Aug. 6, 2019
TMC 422 Installing Active Vibration Isolation for SEMs, upgrading firmware and monitoring performance Tuesday, Aug. 6, 2019
TTP Labtech 1147 Introducing chameleon - next generation sample preparation for single particle Cryo-EM Tuesday, Aug. 6, 2019
TVIPS 720 CMOS based TEM Camera Technology Tuesday, Aug. 6, 2019
Vitatech Electromagnetics 712 ACS and Passive Shielding Integration Tuesday, Aug. 6, 2019
ZEISS Microscopy 1117 A Sneak Preview of the Latest Atlas 5 2D & 3D Features for Crossbeam and SEM Microscopes Tuesday, Aug. 6, 2019
zeroK NanoTech 715 New High-Performance FIB and SIMS Systems Tuesday, Aug. 6, 2019
3D-Micromac AG 816 Laser-Based Sample Preparation for Microstructure Diagnostics with microPREP Wednesday, Aug. 7, 2019
Analitex 820 New TEM software for automated phase analysis and identification of compounds Wednesday, Aug. 7, 2019
Applied Beams LLC 952 CaesiumXL: new life for your FEI XL-series SEM Wednesday, Aug. 7, 2019
DigiM Solution LLC 1254 Cloud image processing with data management, AI, and image-based simulation Wednesday, Aug. 7, 2019
Digital Surf 1352 SEM image 3D reconstruction Wednesday, Aug. 7, 2019
Direct Electron 518 Unique Benefits of the DE-64 for Cryo-EM Wednesday, Aug. 7, 2019
E.A. Fischione Instruments, Inc. 846 Versatile and reliable sample preparation for SEM: Model 1061 SEM Mill Wednesday, Aug. 7, 2019
EMCN/ MA-tek T452 K-kit Meets All Needs for Liquid TEM Wednesday, Aug. 7, 2019
FOM Networks, Inc. 528 Keep Track of User Safety Training Records with FOM Wednesday, Aug. 7, 2019
Gatan 928 What's New in Gatan Microscopy Suite? Wednesday, Aug. 7, 2019
Henan Zhongjingkeyi Technology Co./ MA-Tek Inc. T452 K-kit Meets All Needs for Liquid TEM Wednesday, Aug. 7, 2019
Hitachi High Technologies America 1438 SPARKLE II - Electron Based Electron Microscope Chamber and Specimen Cleaning System Wednesday, Aug. 7, 2019
HREM Research Inc. 537 Quantitative Differential Phase Contrast Wednesday, Aug. 7, 2019
Hummingbird Scientific 1045 Next generation operando TEM liquid cell sample holders Wednesday, Aug. 7, 2019
Leica Microsystems 538 Presentation and Hands-on Session: Serial Sectioning for Array Tomography with the ARTOS 3D Wednesday, Aug. 7, 2019
Linkam Scientific Instruments 551 Tools for Cryo Correlative Microscopy Wednesday, Aug. 7, 2019
Microscopy Innovations 1049 Automated Immunogold Labeling of Biological Specimens for TEM Wednesday, Aug. 7, 2019
MIPAR Image Analysis 1154 Bio Image Analysis: Detecting Complex Features Wednesday, Aug. 7, 2019
NenoVision 750 AFM-in-SEM: Discover advantages and unique features of correlative imaging Wednesday, Aug. 7, 2019
Nion Co. 1102 Nion Swift - A tool for Data Acquisition, Analysis, and Advanced Microscopy Wednesday, Aug. 7, 2019
Object Research Systems 937 Customized Deep Learning Solution in Twenty Minutes Wednesday, Aug. 7, 2019
point electronic GmbH 549 Rediscovering EBAC imaging mode in SEM Wednesday, Aug. 7, 2019
Protochips 644 Operando liquid-electrochemical TEM for monitoring the charge/discharge processes inside Li/Na-ion Batteries Wednesday, Aug. 7, 2019
Quantum Design Inc. 822 Correlative In-Situ Analysis of Nanostructured Materials by Combination of AFM, SEM, and FIB" Wednesday, Aug. 7, 2019
RMC Boeckeler 828 Automated section collection using ATUMtome and ASH2 for the CLEM workflows Wednesday, Aug. 7, 2019
SEMTech Solutions, Inc. 530 Converting Used SEMs to Win10 Capable Systems Wednesday, Aug. 7, 2019
SEMTech Solutions, Inc. 530 BSE Imaging Demonstration on a XL30 ESEM Wednesday, Aug. 7, 2019
Thermo Fisher Scientific 1038 Mitigating Charge in an SEM Wednesday, Aug. 7, 2019
TMC 422 Installing Active Vibration Isolation for SEMs, upgrading firmware and monitoring performance Wednesday, Aug. 7, 2019
Vibration Engineering Consultants 1642 The Importance of the Site Survey: What it Reveals, How to Interpret the Data and Why You Should Work with an Independent Provider Wednesday, Aug. 7, 2019
Vitatech Electromagnetics 712 ACS and Passive Shielding Integration Wednesday, Aug. 7, 2019
ZEISS Microscopy 1117 "Nice image, what am I looking at?" - Nano-analysis on the HIM using VECTOR 500 SIMS Wednesday, Aug. 7, 2019
MSA MAS IFES

2019 Sponsors