All M&M 2018 symposia, workshops and official events will be held at the Baltimore Convention Center.
Physical Sciences Tutorials
Organizer: Donovan N. Leonard, Oak Ridge National Laboratory
X40 - Scanning Nanobeam Diffraction
Presenter: Colin Ophus, Lawrence Berkeley National Laboratory
Traditional scanning transmission electron microscopy (STEM) detectors are large, single pixels that integrate a subset of the transmitted electron beam signal scattered from each electron probe position. These transmitted signals are extremely rich in information, containing localized information on sample structure, composition, phonon spectra, three-dimensional defect crystallography and more. Conventional STEM imaging experiments record only 1-2 values per probe position, throwing away most of the diffracted signal information. With the introduction of extremely high speed direct electron detectors, we can now record a full image of the diffracted electron probe at each position, producing a four-dimensional dataset we refer to as a 4D-STEM experiment. This tutorial will describe the challenges and opportunities created by 4D-STEM.
X41 - Entrepreneurship in the Microscopy Community
Presenter: John Domiano, Protochips
Several entrepreneurs from the microscopy community will be in attendance for a round table Q&A with tutorial attendees on topics including, but not limited to:
- Instrumentation development and commercialization
- Practical steps to take when starting your own microscopy based business
- Panel discussion on business start-up best practices
- Role of local affiliated microscopy societies in bringing microscopists and businesses together
X42 - Ultra-high spatial resolution EBSD: Transmission Kikuchi Diffraction (TKD) in the SEM
Presenter: Scott D. Sitzman, The Aerospace Corporation
- Introduction to TKD: What distinguishes TKD from conventional EBSD, to its benefit and detriment from the standpoint of both the researcher and the practitioner
- Hardware, software and SEM requirements & considerations
- TKD sample preparation
- Advice for high quality data collection
Biological Sciences Tutorials
Organizer: Tommi A. White, University of Missouri
X43 - Cryo-FIB: Overcoming the Hurdle of Sample Preparation for in situ Cryo-Electron Tomography
Presenter: Miroslava Schaffer, Max Planck Institute of Biochemistry, Germany
In recent years, Cryo-Focussed Ion Beam (Cryo-FIB) milling of frozen hydrated specimen has become a key technique for in-situ Cryo-Electron Tomography, immensely broadening the scientific questions which can be tackled. However, the obtainability of results hinges strongly on the quality of the preparation and its reproducibility. In this tutorial, we will present the technique developments at Max Planck in Martinsried and show what is needed for a reliable, high-quality specimen preparation. We will discuss the critical issues of the preparation workflow, including:
- Hardware requirements
- Optimizing freezing conditions
- Different milling strategies
- Protective coatings
- Obtaining homogeneously thin, large field-of-view lamellas
- Avoiding contamination
- Improving sample conductivity
- The influence of different specimen
- Tips and tricks
X44 - Single-particle Cryo-EM: Data Processing Techniques for Obtaining Optimal Results
Presenter: Ali Punjani, University of Toronto
Single-particle cryo-EM is a powerful method for resolving near-atomic resolution of 3D structures of a wide variety of biologically important molecules, including membrane proteins and GPCRs. As data collection and sample preparation mature, and the use of cryo-EM expands, expertise and tools for data processing are critical for achieving state-of-the-art results at high resolutions. In this tutorial, we will present a workflow of data processing methods and advanced algorithms available in the cryoSPARC software package for single particle cryo-EM, guiding the audience through processing stages including:
- Motion correction of microscope movies
- Picking single particles from micrographs
- Cleaning and sorting particle stacks in 2D
- Solving multiple heterogenous structures in 3D
- Refinement of structures and validation
- Advanced refinement techniques to improve resolution
- Tips and tricks
X45 - How to Get Funding for Instrumentation When Budgets Are Tight (Parts I and II)
Presenters - Part I:
Amelia Dempere, University of Florida
James LeBeau, North Carolina State University
Vonnie Shields, Towson University
Frank Macaluso, Albert Einstein College of Medicine
Christine Brantner, George Washington University
Presenters - Part II:
Robert Kokoska, Life Sciences Division, US Army Research Office
Guebre Tessema, National Facilities and Instrumentation Program, National Science Foundation
Malgorzata Klosek, Office of Research Infrastructure Programs, National Institutes of Health
Christine Brantner, George Washington University
Do you have questions about how to land an instrumentation grant for a new high-pressure freezing device or a replacement electron microscope? Then these are the tutorials for you! Decreases in federal and institutional budgets, along with increased competition for those resources, have made it more difficult to obtain funding for equipment. How can you maximize your chances for success? What does a funded grant application look like versus a not-funded one? These two tutorial sessions (Parts I and II) will provide you with advice from two different angles: agency officials and successful grant applicants. Come and hear the tips and tricks that they have to share. Be sure to bring your questions.
