M&M 2018

All M&M 2018 symposia, workshops and official events will be held at the Baltimore Convention Center.

Full Symposium Descriptions

Analytical Sciences Symposia

A01 - Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms

Satoshi Ichikawa, Osaka University, Japan
Masashi Watanabe, Lehigh University

Professor Hatsujiro Hashimoto is one of the pioneers in imaging crystalline solids by transmission electron microscopy (TEM). His many achievements include the development of TEM instruments and holders, pioneering work in atomic-scale imaging and early contributions in understanding diffraction contrast based on dynamical diffraction theory. In addition, Professor Hashimoto performed in situ observations at elevated temperatures as high as 3000°C in the 1960s, fabricated an environmental TEM instrument with a gas reaction chamber and challenged the field to image single atoms using spectrometry techniques in TEM. His tremendous scientific contributions influenced scientists not only in Japan but also across the world. This symposium is dedicated to the memory of Professor Hashimoto and will feature technical aspects spanning a broad range of topics representative of the significant breadth and scope of his work and achievements.

Invited Speakers:

A02 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Miaofang Chi, Oak Ridge National Laboratory
Jing Tao, Brookhaven National Laboratory
Marta Rossell, Electron Microscopy Center, Switzerland

S/TEM capabilities of probing structure and chemistry at atomic resolution are routine in microscopy labs owing to the successful invention and implementation of aberration correctors two decades ago. Accompanying the high spatial resolution is the developments of new and revisited imaging and spectroscopy techniques stimulated by the use of aberration correctors along with the emerging new detectors and data analytics. Notably, the recent advancements in differential phase contrast imaging, precise measurements of atomic positions, atomic-scale holography, high resolution tilt-series tomography, depth sectioning with high convergence angles, and 4D data acquisition provides new imaging capabilities for not only structure and chemistry, but also functionalities of materials, bringing about a transformation in the way the materials being understood and designed. This symposium intends to foster discussions on recent and future developments and applications of aberration-corrected S/TEM.

Invited Speakers:

A03 - Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

Colin Ophus, Lawrence Berkeley National Laboratory
David Muller, Cornell University

STEM experiments that utilize full reciprocal space images of the diffracted converged electron beam at each probe position are becoming increasingly common, due to the widespread adoption of high speed direct electron detectors. These experiments range from micrometer to atomic scale, including measurements of local physical properties, statistical characterization of atomic distributions, phase retrieval methods, and many others. These experiments can also generate an enormous quantity of data, requiring efficient analysis codes and new data handling methods. In this symposium, we will cover a wide range of 4D-STEM experiments, and studies examining both their promise and their limitations.

Invited Speakers:

A04 - In situ Transmission Electron Microscopy in Liquid and Gas Cells

B. Layla Mehdi, University of Liverpool, UK
Damien Alloyeau, CNRS - Paris Diderot University, France
Niels de Jonge, INM - Leibniz Institute for New Materials, Germany
Larry Allard, Oak Ridge National Laboratory

This symposium aims to discuss the multi-disciplinary challenges and opportunities of in-situ transmission electron microscopy (TEM) and scanning TEM (STEM) in liquid- and gas cells. These techniques are used in many fields including electrochemistry, catalysis, energy storage, nanomaterial synthesis, geology, soft materials, and structural- and cell biology. This symposium covers the applications of these techniques, new methods to improve imaging and quantitative analyses, spatial resolution, hardware and software methods needed for improved temporal resolution, and the role of electron-beam effects.

Invited Speakers:

A05 - Low-energy Electron and Particle Microscopies in Liquid, Gaseous, and Frozen Conditions

Andrei Kolmakov, National Institute for Standards and Technology
Olga Ovchinnikova, Oak Ridge National Laboratory
Xiao-Ying Yu, Pacific Northwest National Laboratory
Debbie Stokes, Thermo Fisher Scientific, The Netherlands

Scanning as well as wide-field electron microscopy and spectroscopy at (near-) atmospheric pressure and in the liquid or frozen state have recently demonstrated impressive progress in biomedical, environmental, and energy-related research under realistic conditions. In addition to ESEM and cryo-SEM, breakthroughs in the development of electron transparent, molecularly impermeable membranes integrated into microfluidic/gas flow cells and micro-reactors have increased the range of innovative applications of low energy electron and ion microscopies and analytical techniques such as SIMS, XPS, AES, CL, EDX, and EBSD. This symposium will highlight progress, technical developments and application trends of these novel approaches, serving to increase the visibility of new emerging tools and vendors.

Invited Speakers:

A06 - Mesoscale Correlative Microscopy and Imaging of Physical, Environmental, and Biological Sciences

Xiao-Ying Yu, Pacific Northwest National Laboratory
Si Chen, Argonne National Laboratory
Nestor J. Zaluzec, Argonne National Laboratory

Mesoscale connects the microscopic and macroscopic worlds, encompassing large differences in size, arrangement, complexity, and operating principle. This symposium aims to promote latest scientific findings and emerging techniques for mesoscale observations built upon microanalysis, microscopy, and correlative imaging. Besides electron/optical microscopy and spectroscopy used in various microanalysis, synchrotron-based X-ray microscopy or spectroscopy in conjunction with electron microscopy presents new opportunities to study chemical composition, biology, and material ultrastructure. We invite contributions in biology, catalysis, energy storage, and materials sciences. Presentations noting technical and scientific advancement of correlative spectroscopy and microscopy are encouraged.

Invited Speakers:

A07 - New Advances in Electron Energy Loss Spectroscopy and Allied Techniques

Juan Carlos Idrobo, Oak Ridge National Laboratory
Ian MacLaren, University of Glasgow, UK
Maria Varela, Universidad Complutense de Madrid, Spain

Electron Energy Loss Spectroscopy has been a key tool for the analysis of materials in the (scanning) transmission electron microscope since the introduction of suitable spectrometers in the 1970s. The field continues to expand and develop rapidly, both by the efforts of academic researchers and the equipment manufacturers. This symposium will provide a venue for the discussion of the latest advances in the field of EELS in the (S)TEM.

Invited Speakers:

A08 - Machine Learning & Compressive Sensing for Image Acquisition, Processing, and Reconstruction

Andrew Stevens, Pacific Northwest National Laboratory
Volkan Ortalan, Purdue University
Rowan Leary, Cambridge University, UK

This symposium is concerned with the use of advanced statistical, mathematical, and computational methods for computational/compressive sensing; tomographic, ptychographic, and other reconstructions; and data cleaning/refinement techniques such as denoising and superresolution. Papers will focus on important topics in both machine learning and adaptive/computational sensing — especially their application to the acquisition and refinement of microscope data (e.g. images, spectrographs, ptychographs). The symposium will cover new microscope designs that depend on computational recovery techniques and other novel post facto machine learning and computational techniques to improve data quality or recover a minimum of useful information possibly by leveraging data across multiple sensors. Our target audience is generic microscope users, to introduce new techniques to the community and facilitate communication leading to their adoption.

Invited Speakers:

A09 - Data Analytics and Model-based Imaging for Microstructure and Physical Property Interpretations

Lawrence Drummy, Air Force Research Laboratory
Charles Bouman, Purdue University
Vinayak Dravid, Northwestern University
Alex Belianinov, Oak Ridge National Laboratory

This symposium will cover a breadth of topics from emerging multi-modal microscopy techniques, to modern processing methods after the data has been collected. Machine learning methods discussed here will focus on transforming the raw collected signal into physically interpretable results — the data connection to material properties. Specific attention will be paid to selecting and applying models in order to guide optimal strategy for extracting useful, scientifically relevant information. The symposium will also feature new algorithmic and software developments for data denoising, object tracking, correlative analysis, and data management for end use.

Invited Speakers:

A10 - The Joy of Scanning Electron Microscopy

Raynald Gauvin, McGill University, Canada
Dale Newbury, National Institute of Standards and Technology

First introduced commercially in 1965, the scanning electron microscope (SEM) has evolved into a core microscopy characterization tool for thick (electron-opaque) specimens, capable of imaging nanometer-scale features with a variety of contrast mechanisms: topographic, compositional, crystallographic, magnetic, and electrical potential. Augmented with energy dispersive X-ray spectrometry (EDS) and electron backscatter diffraction (EBSD), SEM can characterize morphology, elemental composition and crystal structure. Recently, amazing capabilities using STEM-in-SEM have been demonstrated making the SEM more valuable than ever for materials characterization. This symposium will present a comprehensive overview of SEM as a problem-solving tool whose capabilities are still being developed and extended.

Invited Speakers:

A11 - Solid-state X-ray Spectrometry at 50 Years

Paul Carpenter, Washington University
Edward Vicenzi, Smithsonian Institution
Katherine Burgess, Naval Research Laboratory
Nicholas Ritchie, National Institute of Standards and Technology

50 years ago, Fitzgerald, Keil, and Heinrich published the first results obtained from an energy-dispersive x-ray spectrometer (EDS) in Science. From identification of unknown materials, to compositional mapping and quantitative microanalysis, EDS has advanced our understanding of an enormous range of materials and is used worldwide in microanalysis and microscopy laboratories. The symposium will link historical and technical developments of solid state x-ray instrumentation, data processing, applications, and emerging detection systems. Perspectives on the developments in EDS from a technological and educational perspective will be featured, including invited and contributed presentations from the inventor, vendor, and scientific communities.

Invited Speakers:

A12 - The FIB-SEM Laboratory: Sample Preparation and Beyond

Joshua F. Einsle, University of Cambridge, UK
Marco Cantoni, École Polytechnique Fédérale de Lausanne, Switzerland
Timothy Burnett, University of Manchester, UK

The modern FIB-SEM microscope combines the high-resolution scanning electron microscopy (SEM) analytical techniques and the site-specific nanoscale milling capabilities of a focused ion beam (FIB). In this symposium, we welcome contributions covering novel studies and ongoing developments combining the nanofabrication capabilities of the FIB-SEM with analytical characterization and/or in situ testing. Research across a broad range of materials applications is sought with the intent for contributors to share knowledge on optimal utilization of this technology. We wish to highlight that the FIB-SEM is more than a transitory step on the way to other microscopic modalities, but truly, a laboratory space in its own right.

Invited Speakers:

A13 - Pushing the Limits of Cryo-EM

Mike Marko, Wadsworth Center
Anchi Cheng, New York Structural Biology Center

Cryo-EM provides single-particle maps with resolution in the 3 angstrom range, and sub-tomogram-averaged maps in the 1nm range, all with the sample in a near-native, hydrated state. This symposium will highlight technology and applications, with invited speakers who are key to the latest developments, and will include contributed papers from participants in this exciting field.

Invited Speakers:

A14 - Quantitative Magnetic Characterization in the TEM

Darius Pohl, IFW Dresden, Germany
Ben McMorran, University of Oregon
Martha McCartney, Arizona State University
Sebastian Schneider, IFW Dresden, Germany

In this symposium, transmission electron microscopy techniques for imaging magnetic fields, such as Lorentz microscopy, differential phase-contrast (DPC), electron holography, and electron energy-loss magnetic chiral dichroism (EMCD), are emphasized. As functional magnetic materials continue to decrease in size, surfaces and interfaces play a growing significance on novel nanoscale magnetic phenomena. Further, skyrmions and topological insulators have recently received widespread interest leading to an increasing demand for high resolution quantitative magnetic measurements in combination with local structural characterization. With recent advances in mind, the goal of this symposium is to bring together experimentalists involved in applying/developing magnetic techniques and those involved in simulations and/or the development of theory to explain quantitatively magnetic phenomena with TEM.

Invited Speakers:

A15 - Strain Analysis from Nano- to Micro-length Scales

Brendan Foran, The Aerospace Corporation
Ling Pan, Intel Corporation
Guoda Lian, IBM East Fishkill

This symposium focuses on the application of microscopy and microanalysis techniques to investigate strain across various length scales. For example, transmission EM based methods such as geometric phase analysis, precession nano-beam diffraction and dark field holography are providing significant insights on nanoscale strain in transistor devices. Scanning electron microscopy based methods like high-resolution electron backscatter diffraction (HR-EBSD) and transmission Kikuchi diffraction (TKD) are achieving excellent strain sensitivity and nanometer resolution, respectively. X-ray scattering methods and Raman spectroscopy are bridging the micro and nano length scales. We encourage contributions highlighting developments in strain measurements and mapping approaches from across a wide range of technological applications and materials systems including (but not limited to) semiconductors, ceramics, and metals.

Invited Speakers:

A16 - Sterling Newberry Memorial Symposium on X-ray Imaging

Jeffrey Davis, PNDetector
Nikolaus Cordes, Los Alamos National Laboratory
Eric Telfeyan, General Electric
Richard Wuhrer, Western Sydney University, Australia

This symposium is being held in honor of one of the pioneers of X-ray microscopy and founders of the Microscopy Society of America, Sterling Newberry. In honor of his work, the symposium will focus on a wide range of X-ray imaging techniques, including computed tomography, coherent X-ray imaging and X-ray microscopy. We are also soliciting papers on imaging using focused probe techniques such as µXRF and µXRD, correlative imaging techniques and direct applications of X-ray imaging to solving complex problems in materials science and engineering. The symposium will also include contributions on new detectors, software and analytical tools for X-ray imaging.

Invited Speakers:

A17 - Surface and Subsurface Microscopy and Microanalysis

Vincent S. Smentkowski, General Electric
John A. Chaney, The Aerospace Corporation
Chanmin Su, Bruker-Nano Inc.
Xiao-Ying Yu, Pacific Northwest National Laboratory

Surface properties such as composition, uniformity, thickness, and topography dictate the performance of many systems. The surface analyst is asked to detect and image species present in ever-lower concentrations and within ever-smaller spatial and depth dimensions. This symposium will emphasize state-of-the art surface analysis and interpretation methods encompassing all aspects of surface mass spectrometry; scanning probe microscopy; and nano-scale chemical and physical property analysis via TERS, IR, and other probe based techniques. We will also cover advanced data analysis tools; correlative imaging (e.g., AFM and SEM; AFM and SIMS; etc.); the use of complementary surface analytical instrumentation to perform a complete analysis of complex material systems; and surface analytical challenges. Contributed papers are solicited for both platform and poster presentations.

Invited Speakers:

A18 - Vendor Symposium

Luisa Amelia Dempere, University of Florida, Gainesville
Andreas Holzenburg, University of Texas, Rio Grande Valley

This symposium is a forum for vendors to highlight advances in the development and improvement of their products. It covers new methods and technologies that advance the fields of microscopy and microanalysis for both physical and biological sciences, and provides a forum for exchange of ideas and best practices.

 

Biological Sciences Symposia

B01 - Microscopy and Analysis in Forensic Science

Keana Scott, National Institute for Standards and Technology
Robert Pope, Department of Homeland Security
Eric Steel, National Institute for Standards and Technology

The symposium topics will include the application of various microscopy and spectroscopy techniques in forensic case samples and research. The techniques of interest are, but not limited to, electron and ion microscopy, x-ray microanalysis, confocal microscopy, atomic force microscopy, FT-IR imaging, Raman mapping, neutron scattering, and 3D surface metrology. Topics will include case histories and the type of evidence presented for examination, identification and characterization of trace evidence and sample preparation for microscopic examination. Also included will be the interpretation of case-related microscopic and spectral results, forensic research topics, and preparation and presentation of the results of microscopic analyses of trace evidence for court testimony.

Invited Speakers:

B02 - Microscopy in Food Science: Bridging Biology and Materials Science

Almut Vollmer, Utah State University
Nabil Youssef, Utah State University

Recent advances in instrumentation have promoted the revival of microscopy in food science, an area not traditionally covered at microscopy meetings, yet of broad practical importance. This symposium gives an overview of how various microscopy techniques have been utilized to gain a deeper understanding of complex food systems at the interface of biology and materials science. Scientists from industry, academia and government are encouraged to participate and use this symposium as a platform to exchange ideas and expertise in a research field that heavily depends on interdisciplinary approaches.

Invited Speakers:

B03 - 3D Structures: from Macromolecular Assemblies to Whole Cells (3DEM FIG)

Joaquin Ortega, McGill University, Canada
Michael Radermacher, University of Vermont
Teresa Ruiz, University of Vermont

Our understanding of the 3D structure and functional subtleties of complex biological systems has skyrocketed due to recent advances in EM imaging technology and hybrid methodologies. This symposium will highlight structural studies of macromolecules, microorganisms, cells, and tissues using state-of-the-art high-resolution techniques. These techniques include electron crystallography, single particle cryo-EM, helical reconstruction, STEM; AFM, X-ray crystallography, and molecular modeling. Biological topics of interest include: cellular architecture, metabolism, trafficking, communication, and division; gene regulation, transcription, and translation; host-pathogen interactions and virus structure; In situ studies using TEM and SEM, and all aspects of structure-function studies of biological assemblies.

Invited Speakers:

B04 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals

Greg Ning, Pennsylvania State University
Ru-Ching Hsia, University of Maryland, Baltimore
Trace Christensen, Mayo Clinic

Microscopy is critically important in the ongoing research, detection, diagnosis and treatment of diseases. Advances in microscopy techniques provide us with an improved ability to diagnose and study the origins and development of diseases in human, plant and animal specimens. This symposium is an opportunity to share information on the microscopic investigation of cells, tissues and entire organisms in clinical, diagnostic and research laboratories. Emphasis is placed on using latest or innovative sample processing techniques or instrumentation in both clinical and research laboratories.

Invited Speakers:

B05 - Focused on Microbes!

Alice Dohnalkova, Pacific Northwest National Laboratory
Xiao-Ying Yu, Pacific Northwest National Laboratory

Microscopy and microanalysis are important in understanding and characterizing all aspects of microbiology and systems biology including bacteria, fungi, and other microbes. We invite presentations on all topics of environmental processes but not limited to: microbial interactions with metals and minerals, with plant root and leaf; symbionts, pathogens and immune reactions, and biofilm formation on various surfaces. Contributions presenting novel optical and electron microscopic tools and method development, educational outreach, and scientific findings in microbial interactions are strongly encouraged.

Invited Speakers:

B06 - Imaging Life at New Frontiers of Spatiotemporal Resolution and Adaptive Microscopy

Jay Potts, University of South Carolina Medical School
Teng-Leong Chew, Janelia Research Facility (HHS)

This symposium presents three important frontiers that have recently transformed optical imaging, including (i) the various methods in breaking the diffraction limit to achieve super-resolution microscopy, (ii) the renaissance of selective plane illumination (light sheet) microscopy and (iii) the integration of adaptive methods into optical microscopy to correct for the heterogeneity in refractive indices, dynamic changes in sample size during development of living specimens. These technologies have in turn ushered in an era of big data and promises to image life on scales previously thought impossible. In this symposium, we aim to highlight the exciting possibilities and hurdles faced by modern optical microscopy. In addition, the sypmposium will cover new developments and techniques used to image life as never before.

Invited Speakers:

B07 - Pharmaceuticals: Imaging, Analysis, and Regulation of Medical Products and Devices

Jason Mantei, Baxter
Gianpiero Torraca, Amgen

This symposium will present diverse content related to the research, development, manufacture, and use of pharmaceuticals and medical products/devices. Content will feature the use of advanced techniques to address the unique problems that arise during drug discovery, vaccine research, formulation, biocompatibility, production, product life cycle, and eventual patient use. In-depth technical presentations will describe the development of methods specially optimized for use with these real-world materials and biological systems, including hybrid and correlative techniques. Additionally, given the proximity of the conference to regulatory bodies in the US, there will be a secondary focus on discussing and understanding regulations and data integrity concerns as they specifically apply to the pharmaceutical industry.

Invited Speakers:

B08 - 3D Structure of Complex Soft Materials Derived From Electron Tomography

Deborah Kelly, Virginia Tech Carilion Research Institute
Steven Ludtke, Baylor College of Medicine
Elizabeth Wright, Emory University School of Medicine

Electron tomography (ET) is trailblazing the resolution revolution in the EM field. Recent advances in sample preparation, instrumentation and methodology have widened the scope of ET to reveal information at sub-nanometer resolution and target length scales in the micrometers. This symposium will highlight leading scientific and technological developments in structural studies of complex systems in biology and materials science, using the widest possible range of ET imaging approaches and their integration with complementary techniques. Applications and developments covering - but not limited to - aberration-corrected, energy-filtered TEM and STEM, phase plates, diffraction and holography, are invited. Contributions including complementary approaches such as correlative light-electron microscopy, X-ray tomography, serial-block face SEM/AFM, and novel processing tools — including sub-volume alignment, classification and averaging are encouraged.

Invited Speakers:

 

Physical Sciences Symposia

P01 - Advances in Electron, X-ray and Neutron Spectro-imaging/Holography of Energy Materials and Devices

Feng Wang, Brookhaven National Laboratory
Chongmin Wang, Pacific Northwest National Laboratory
Kazuo Yamamoto, Japan Fine Ceramics Center, Japan
Michael Toney, Stanford University

In order to address fundamental questions related to energy storage and conversion, there have been significant efforts in developing electron, X-ray and neutron techniques with improved spatial and temporal resolution and chemical sensitivity. These efforts better resolve the dynamic structural and chemical changes within materials, at interfaces and in devices. Developments in sample environment and in situ capabilities open new opportunities for probing proton, lithium, oxygen, and other charge/mass carriers, and tracking their transport in liquid, solid and across liquid-solid/solid-solid interfaces. This symposium focuses on recent advances in electron, X-ray and neutron spectro-imaging/holography techniques for characterizing materials, interfaces and devices related to energy and nuclear applications, such as electrochemical energy storage, fuel cells, photocatalysis, photovoltaics, thermoelectrics and nuclear energy systems.

Invited Speakers:

P02 - Atomically Thin 2D Materials: Recent Results and Challenges

Raul Arenal, Universidad de Zaragoza, Spain
Quentin Ramasse, SuperSTEM Laboratory, UK

Recently, 2D materials, down to atomically thin crystals, have been a clear point of interest for research. This significant interest comes mainly from the attractive electronic, optical and mechanic properties (among others) that this kind of materials can display; as well as a vast number of potential applications. TEM techniques (structural and analytical modes) have provided major advances in the study of these materials, including, very rich information at the atomic scale. This symposium will focus on the state-of-the-art, current challenges and perspectives of TEM studies in these materials. However, studies employing other characterization techniques, including Raman and infrared spectroscopy, XPS, photoluminescence, cathodoluminescence and scanning probe microscopy are also of interest, alongside contributions calling upon theoretical modeling to predict the properties and structure of these fascinating materials.

Invited Speakers:

P03 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications

Zonghoon Lee, Ulsan National Institute of Science and Technology, Korea
Moon Kim, University of Texas, Dallas

With recent advances in synthesizing 0D and 1D materials with various morphology for their specific needs, they are now poised to make disruptive advances in energy, nano-electronics, health, and environment-related areas. These low dimensional materials are also stimulating new applications in many new areas. This symposium will cover various aspects of advanced 0D and 1D materials including synthesis, properties and characterization by TEM, STEM, spectroscopy, diffraction, in-situ methods and other surface analytical techniques, theoretical modeling, and technological applications. Presentations are sought from the areas of nanoparticles, nanowires and nanotubes, growth morphology, defects, surfaces, interfaces, and new and emerging applications.

Invited Speakers:

P04 - In situ Methods for Probing Properties and Dynamics in Materials

Sanjit Bhowmick, Bruker Nano Surfaces
Chaoying Ni, University of Delaware
Andrew Minor, University of California, Berkeley and Lawrence Berkeley National Laboratory

In situ methods inside electron microscopes provide unique insight into the dynamics of materials in response to external stimuli at the micrometer, nanometer, and atomic scale. Recent advances in microscopy techniques, analytical detectors, high-speed cameras, and computing resources are able to provide unprecedented insights and fundamental understanding of intrinsic behavior of materials, assemblies and devices as they are exposed to mechanical forces, heating, photon irradiation, electromagnetic fields. The focus of this symposium is to bring together those in the microscopy and characterization community that are active in the development and application of in situ methods. Contributions are sought regarding key developments in the discoveries, techniques, and experimental methods that aid in the fundamental understanding of properties and mechanisms of small-scale materials, assemblies and devices.

Invited Speakers:

P05 - Minimizing Beam-sample Interactions by Modulating Electron Beams in Space and Time

Christian Kisielowski, Lawrence Berkeley National Laboratory
Joerg Jinschek, The Ohio State University
David Flannigan, University of Minnesota
Hector Calderon, Instituto Politécnico Nacional, Mexico

In high resolution electron microscopy objects are actively altered by the intense electron irradiation that is necessary to reach single atom sensitivity. In these circumstances, a control of beam-sample interactions is no longer a commodity but a necessity. It is of outstanding interest to develop new tools and concepts that strive for a stricter control of the probing electron beam in space and time in order to optimize the detection of every scattering event. Further, new insights on the physical mechanisms of beam-matter interaction is critical for atomic scale imaging. This symposium welcomes contributions that exercise improved control of electron beam-induced alterations of soft and hard matter with the goal to reveal its genuine state. Efforts to further our understanding of the fundamental effects of the electron on different environments and at interfaces are also welcome, as well as topics discussed in the 2017 Radiation Damage Pre-Meeting Congress.

Invited Speakers:

P06 - Applications of Integrated Electron Probe Microscopy and Microanalysis in Characterizing Natural and Synthetic Materials

Kat Crispin, Pennsylvania State University
Colin MacRae, CSIRO Mineral Resources, Australia
Owen Neill, University of Michigan

Electron beam instruments have been merging with other techniques to extract information such as bonding, valence, and density-of-state, which, combined with elemental analysis, offers new insights into the structure and chemistry of natural and synthetic materials. Researchers now have access to an analytical toolbox enabling characterization in a range of controlled environments (liquid and gas) and conditions (elevated temperatures to liquid helium). This symposium showcases synergies of new and emerging techniques, while highlighting recent advances in areas such as optical analysis using Raman spectroscopy, cathodoluminescence, soft X-ray spectrometry, and others. Contributions covering some or all of these new developments and re-emerging technologies are welcomed.

Invited Speakers:

P07 - Planetary Building Blocks and the Techniques Needed to Analyze Them

Tom Zega, University of Arizona
Michelle Thompson, NASA Johnson Space Center
Emma Bullock, Carnegie Institution for Science

After successful missions to collect solar wind (NASA Genesis), cometary dust (NASA Stardust), and asteroidal regolith (JAXA Hayabusa) and with the successful launches of the JAXA Hayabusa2 and NASA OSIRIS-REx missions, the planetary-materials community is firmly within the era of sample return. The proposed symposium solicits papers that use microscopy and related techniques to explore the origins of planetary materials. We welcome contributions that discuss a range of topics including but not limited to: current analytical approaches, developments in new characterization strategies, developments in spatial and spectral resolution for pushing spectroscopic detection sensitivity and precision, and new protocols for sample handling.

Invited Speakers:

P08 - Spectroscopic and Imaging Studies in Heritage Science

Edward Vicenzi, Smithsonian Institution
John Mansfield, University of Michigan
Thomas Lam, Smithsonian Institution

The application of microscale and nanoscale characterization techniques to the examination of cultural heritage materials has greatly enhanced our understanding of the processes that formed, and subsequently transformed those materials to their present state. Understanding the chemistry and morphology of heritage materials from the macro/mesoscopic scale to the microscale is of critical importance for our increasingly deeper levels of knowledge of the interaction between objects and their environment. This symposium will include invited and contributed presentations from students, conservators, conservation scientists, researchers, and those from other disciplines who have an interest in the preservation of cultural heritage.

Invited Speakers:

P09 - Microstructure and Mechanics Deformation Symposium

Frank Muecklich, Saarland University, Germany
James Martinez, NASA Johnson Space Center

This symposium will focus on the further development of advanced 2D microstructure analysis as well as the application and development of tomographic techniques and 3D microstructure analysis including sophisticated 3D data evaluation. It is important to consider the measurement of mechanical properties in conjunction with methods for visualizing a material's microstructure and its evolution during processing or deformation. Small-scale mechanical techniques such as ex situ and in situ compression, tension, bending or indentation generate fundamental insight into deformation processes that can be paired with structural techniques such as atom-probe tomography, electron tomography, synchrotron tomography and related digital image correlation methods.

Invited Speakers:

 

MSA MAS MSC

2018 Sponsors