M&M 2017

Full Symposium Descriptions


Biological Sciences Symposia


B01 Gina Sosinsky Memorial Symposium: Imaging of Cellular Communications

Bernard Heymann, Esther Bullitt, Alasdair Steven

Gina Sosinsky�s recent passing represents a severe loss. Gina was a valuable contributor to the 3DEM community and a delightful person. We are organizing this symposium to honor her and her work on cellular communication. One of her main interests was the junctions between eukaryotic cells, and how these serve both structural and communication functions. The former is essential to maintain the integrity of tissues, while the latter ensures propagation of signals between cells. Gina made important contributions to how gap junctions form selective channels between cells, and couple their cytoplasms to allow solute exchange. Adherens junctions and desmosomes provide mechanical contacts involved in transmitting force signals. Tight junctions offer selectivity to the passage of solutes in the spaces between cells. Retinoschisin is involved in maintaining the layered structure of the retina. Synaptic transmission affords the communication of information. The extracellular matrix forms a scaffolding for these and other proteins in the interstices between cells. Defects in these proteins cause debilitating diseases. The symposium will highlight the progress that has been made towards determining the structures and functions of proteins mediating cell-cell interactions using electron microscopy, light microscopy and other visualization techniques.

Invited Speakers:

  • Mark Ellisman, University of California, San Diego
  • Atsunori Oshima, Nagoya University, Japan
  • Dorit Hanein, Sanford-Burnham-Prebys Medical Discovery Institute
  • Bernard Heymann, National Institutes of Health


B02 Microstructure Characterization of Food Systems

Jinping Dong, Joel Wallecan

Understanding of microstructure and functionality correlations leads the recent trend in food research. Various microscopy and microanalysis techniques are constantly employed by scientists to characterize food microstructures. However, many challenges are faced in this field due to the high complexity nature of the food. Many unique imaging and characterization methods have been developed in individual labs. There is a high demand for the exchange of experience and knowledge in the field, which is the intent of this symposium. This symposium will present applications of microscopy related techniques to characterize food microstructures and to draw their relationship with functionalities. Topics include, but are not limited to light, fluorescence, electron, ion, x-ray, and spectroscopy based microscopy techniques with their applications in food research.

Invited Speakers:

  • Chathurada Sage Gajadeera, University of Minnesota
  • Owen Jones, Purdue University
  • Joël Wallecan, Cargill
  • Peter Lillford, University of Birmingham
  • Steven Zbylut, General Mills


B03: Imaging the Biology of Cells and Tissues: Just Do It Right

Eduardo Rosa-Molinar, Jay Potts

This symposium will serve as a forum for the exchange of information, ideas, and knowledge regarding rigor and reproducibility in imaging sciences, a topic of increasing frequency and importance. Assuring confidence in and reproducibility of imaging results and their interpretation requires thoughtful consideration of the microscopic and experimental controls and procedures, detailed reporting of experimental design, methodologies, and means of analysis, as well as a review of a long and rich literature in the imaging sciences. Using case studies, panelists will discuss the most significant and recurring imaging issues, strive to reach a consensus about the extent to which rigor and reproducibility is a problem, and, suggest individual and organizational means of addressing the concern. Target attendees include undergraduate and graduate students, post-doctoral researchers, and scientists of all levels of experience/expertise and related backgrounds.

Invited Speakers:

  • Le Trinh, University of Southern California
  • Paul Kulesa, Stower Institute for Medical Research
  • Richard Powell, Nanoprobes Inc.
  • John Rash, Colorado State University


B04 3D and Intravital Imaging in Development and Beyond

David Entenberg, Kevin Eliceiri, Sandra Rugonyi

While conventional optical imaging tools like 2D in vitro assays offer the ability to tightly and reproducibly control experimental conditions, they do not adequately reflect the topography or diversity of environments encountered by cells in vivo. 3D and intravital imaging can remove these restrictions and restore the heterogeneity of environments present in the living organism. For example, 3D organoid cultures free cells from the culture dish's two dimensional confines revealing more physiologically relevant motility and extracellular matrix interactions; whole mount imaging preserves the structural integrity and spatial arrangement of the living organism; and intravital imaging further restores multiple host cell interactions, connection to lymphatic and vascular circuits and regulatory signals from distant organs. These increasingly more physiological environs come at the price of greatly increased challenges for the design of experiments and extraction of interpretable information from them. This session is intended to be a forum for highlighting new developments and techniques in the art and science of 3D and intravital imaging as well as what can be learned from their application to areas ranging from development to pathology.

Invited Speakers:

  • Jan Huisken, University of Wisconsin and Morgridge Institute
  • Mary Dickensen, Baylor College of Medicine


B05 Pharmaceuticals and Medical Science

Bridget Carragher, Jason Mantei

This symposium will present diverse content related to the manufacturing and use of pharmaceuticals and medical products. There will be detailed case studies that demonstrate the use of advanced techniques to address the unique problems that arise during drug discovery, vaccine research, formulation, biocompatibility, production, product life cycle, and eventual patient use. There will also be in-depth technical presentations covering the development of methods specially optimized for use with these real-world material and biological systems. The research may involve use of hybrid or correlative techniques that are inclusive and generally include any of the instruments and methods found in the exposition. As always, contributed papers for both platform and poster presentation are encouraged.

Invited Speakers:

  • Giovanna Scapin, Merck
  • Priyamvada Scharya, National Institutes of Health
  • Gabriel Lander, The Scripps Research Institute
  • Debra Joslin, McCrone Associates
  • Jim Troedel , Baxter Healthcare


B06 3D Structures of Macromolecular Assemblies, Cellular Organelles, and Whole Cells

Deborah F. Kelly, Elizabeth Wright, Teresa Ruiz

Our understanding of the 3D structure and functional subtleties of cells, microorganisms and macromolecular assemblies has skyrocketed due to recent advances in EM imaging technology and hybrid methodologies. This symposium will highlight structural studies of cells, microorganisms and macromolecules using state-of-the-art high resolution techniques. These techniques include, electron tomography; electron crystallography; single particle cryo-EM; helical reconstruction; STEM; AFM; X-ray crystallography, and molecular modeling. Biological topics of interest include: cellular architectures, metabolism, trafficking, and division; gene regulation, transcription, and translation; host-pathogen interactions and virus structure; In situ studies using TEM and SEM; and all aspects of structure-function studies of biological assemblies.

Invited Speakers:

  • Alasdair Steven, National Institutes of Health
  • Melanie Ohi, Vanderbilt University Medical School
  • Jason Mears, Case Western Reserve University School of Medicine
  • Elitza Tocheva, Université de Montréal, Canada
  • Elizabeth Villa, University of California, San Diego
  • Terje Dokland, University of Alabama, Birmingham


B07 Bridging the Gap: Technologies and Methods for Correlative Light and Charged Particle Microscopy of Biological Systems

James A.J. Fitzpatrick, Matthew S. Joens, Joshua Z. Rappoport

Correlating light and charged particle (both electron, ion and x-ray) microscopy methodologies serves to bridge the multi-scale gap that hinders both the two- and three-dimensional analyses of rare cellular and sub-cellular level events that remain beyond reach due to the diffraction limit of light. The need to correlate information obtained from both types of datasets has proven a significant challenge, but has evolved in recent years with the advent of new probes, processing techniques, and detectors with substantially increased sensitivity. We seek to highlight the scientific innovations that address the correlation of light and charged particle microscopy of biological samples and soft materials. This symposium is intended to be a forum for the dissemination of correlative workflows and advanced sample preparation methods. Invited papers would include those describing novel approaches for correlating information from multiple light modalities with x-ray, electron and ion microscopy datasets. Of particular interest are innovative developments of new CLEM probes and contrast agents, advanced methods for ultrastructural preservation and dynamic in situ measurements. Target attendees will include engineers and scientists from all levels of bio-imaging expertise and all related backgrounds.

Invited Speakers:

  • Roger Wepf, University of Queensland, Australia
  • Mark Ellisman, National Center for Microscopy and Imaging Research
  • David Piston, Washington University
  • Paul Verkade, University of Bristol, UK


B08 Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals

Gang (Greg) Ning, Ru-ching Hsia, Trace Christensen, Jon Charlesworth

Microscopy is not only useful but also critically important in the ongoing research, detection, diagnosis and treatment of disease. Advances that improve rapid and accurate detection and treatment often involve the use of various microscopic techniques. These varied techniques provide us with an improved ability to diagnose and research the origins, development and response of diseases in human, plant and animal specimens. This is an opportunity to share information on the investigation of pathogenic cells, tissues and entire organisms in clinical, diagnostic and research laboratories. Emphasis will be placed on using latest microscopy in both clinical and research laboratories.

Invited Speakers:

  • Hani Suleiman, Washington University School of Medicine
  • James Fitzpatrick, Washington University School of Medicine
  • Eric Wartchow, Children's Hospital Colorado
  • Keith Cheng, Pennsylania State University School of Medicine


Physical Sciences Symposia


P01 Characterization of Semiconductor Materials and Devices

Moon J. Kim, Michael Gribelyuk, Jayhoon Chung, Esther Chen

The symposium aims to review progress in advanced characterization of current and emerging semiconductor materials and devices. This includes 3-D and planar devices, wide-gap semiconductors and heterostructures for nanoelectronics applications. The emphasis is on understanding the microstructure, defects, failure mechanisms, correlation of structure with device performance. Presentations are sought to include state-of-the-art characterization of current semiconductor materials/devices as well as new and emerging semiconductors.

Invited Speakers:

  • Zonghoon Lee, Ulsan National Institute of Science and Technology (UNIST), South Korea
  • Myung-Geun Han, Brookhaven National Laboratory
  • Bianghu Fu, GlobalFoundaries
  • Martha McCartney, Arizona State University
  • Jean-Luc Rouviere, CEA - Univ. Grenoble Alpes INAC/MEM/LEMMA, France


P02 TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Ian MacLaren, Philip E. Batson

New monochromated microscopes and new high stability EEL spectrometers are allowing dramatic advances in understanding low energy excitations in materials, nanostructures and even organic molecules at high spatial resolution. This includes atomic and molecular vibrations, low energy electronic excitations (e.g. interband transitions), and surface plasmons. Scanning Near-Field Optical Microscopy, SNOM, uses optical techniques to obtain similar information. Topics of interest will include new developments in each field and cross-disciplinary discussion. Contributions are invited on hardware developments; software techniques and algorithms for data analysis; theory of the measurement science; low loss interactions between fast electrons and solids and near-field optical interactions with matter; and applications covering both physical and biological sciences. Additionally contributions would be welcomed where these new developments are correlated with complementary techniques such as Raman spectroscopy, cathodoluminescence, inelastic neutron scattering, and low energy electron based high resolution EELS.

Invited Speakers:

  • Surong Gao, Max Planck Institute for Solid State Research, Germany
  • Luis Galvao-Tizei, Université Paris-Sud, France
  • Les J. Allen, University of Melbourne, Australia
  • Markus Raschke, University of Colorado
  • Peter A. Crozier, Arizona State University


P03 Advanced Microscopy and Microanalysis of Complex Oxides

Xiaoqing Pan, Peng Wang, Elizabeth Dickey

Complex oxide materials exhibit a broad range of functional properties, such as high temperature superconductivity, metal-insulator transitions, colossal magnetoresistance, (anti-) ferromagnetism, (anti-) ferroelectricity, piezoelectricity, and multiferroicity. In many of these materials, unique functionality is derived from local structure and disorder, and there is a need to understand the interplay between chemistry, atomic structure and electronic structure at the atomic scale and across correlation lengths of tens to hundreds of nanometers. In addition, recent technical advances in the atomic-scale synthesis of oxide materials have provided a fertile new ground for creating fascinating phenomena and novel states of matter at their interfaces. A completely new class of electronic devices can be envisaged and engineered by tailoring the physical properties on the atomic scale. This symposium will focus on analytical transmission electron microscopy techniques, aberration-correction, spectroscopy, and in-situ methods to characterize these emerging properties across interfaces, thin films and bulk materials for the understanding of new phenomena that occur in these complex-oxide materials. We welcome contributions that report on ether new technique advances or novel applications of microscopy and microanalysis tools.

Invited Speakers:

  • Xiuliang Ma, Chinese Academy of Sciences, China
  • María Varela, Universidad Complutense de Madrid, Spain
  • Huolin Xin, Brookhaven National Laboratory
  • Yuichi Ikuhara, The University of Tokyo, Japan
  • Jiyan Dai, The Hongkong Polytechnic University, Hong Kong
  • Andre Mkhoyan, University of Minnesota
  • Brian Gorman, Colorado School of Mines
  • Alexandre Gloter, Université Paris Sud, France
  • James LeBeau, North Carolina State University
  • Susanne Stemmer, University of California, Santa Barbara


P04 Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices

Marta D. Rossell, Jordi Arbiol, Valeria Nicolosi, Quentin Ramasse

Low-dimensional systems, which are restricted in one, two or even three dimensions, exhibit many properties that are notably different from those of their bulk counterparts. With reduction in size, intriguing and extraordinary electronic, thermal, mechanical, chemical, magnetic, and optical phenomena can be introduced. Suitable control of the properties and responses of these low-dimensional structures may result in the development of new devices and disruptive technologies. This symposium will focus on the use of cutting-edge microscopy and microanalysis techniques to characterize these emerging low-dimensional structures and devices. The techniques include, but are not limited to, analytical transmission electron microscopy techniques, aberration-correction, spectroscopy, and in-situ methods (optical, electronic, mechanical�). Of particular interest are contributions that apply state-of-the-art instrumentations to investigate and model defects, interfaces, diffusion, ordering, and doping. Presentations are sought from the areas of nanowires, nanotubes, nanoribbons, nanobelts, nanosheets, rings, heterostructures, homostructures, and quantum structures.

Invited Speakers:

  • Sara Haigh, The University of Manchester, UK
  • Maya Bar Sadan, Ben-Gurion University, Israel
  • Juan G. Lozano, University of Oxford, UK
  • Kimberly Dick-Thelander, Lund University, Sweden
  • András Kovács, Forschungszentrum Jülich, Germany
  • Andreas Rosenauer, University of Bremen, Germany
  • César Magén , University of Zaragoza, Spain


P05 Imaging and Spectroscopy of Beam-Sensitive Materials

K. Andre Mkhoyan, Osamu Terasaki, Ray F. Egerton, Prashant Kumar

This symposium will highlight (not limited to) the experimental and theoretical research advances for electron beam sensitive materials in innovative imaging and spectroscopy methods, electron beam damage mechanisms, low-dose analytical TEM/STEM and SEM imaging, EELS and EDX spectroscopy, and analysis. Need of cleaner, environment friendly technologies for energy production, storage and electronics in the future, has created a demand for advanced materials and devices. Metal-organic frameworks (MOFs), zeolites and mixed organic-inorganic composites have shown huge potential in catalysis, separation, carbon capture and energy storage. However, these materials bring unique challenges due to their very-high electron beam-sensitivity, making routine imaging and spectroscopy a challenge.

Invited Speakers:

  • Eric Stach, Brookhaven National Laboratory
  • Alvaro Mayoral, Universidad de Zaragoza, Spain
  • Xueyi Zhang, The Pennsylvania State University
  • Kenneth Downing, Lawrence Berkeley National Laboratory
  • Nan Jiang, Arizona State University


P06 Nanoparticles: Synthesis, Characterization, and Applications

Thomas W. Hansen, Abhaya Datye, Marc-George Willinger

Nanoparticles find a wide range of applications varying from food additives, medical applications as well as industrial catalysis. A broad array of techniques is utilized to study nanoparticles, but they tend to average information over a large collection of particles. Electron microscopy remains the most important technique since it provides information at the level of single particles. As the level of resolution has approached the atomic scale, with the wide spread deployment of aberration correction, we can do a lot more than determine particle size distributions.

In this symposium we aim at highlighting the properties of nanoparticles as determined from electron microscopy and related techniques. We seek contributions that highlight novel synthesis techniques to prepare nanoparticles, especially those that combine organic and inorganic materials. We will highlight the essential role of computational modelling through molecular dynamics simulations and density functional theory that help us in understanding the properties of nanoparticles.

Invited Speakers:

  • Thierry Epicier, INSA Lyon, France
  • Ilke Arslan, Pacific Northwest National Laboratory
  • Damien Alloyeau, University of Paris, France
  • Lewys Jones, University of Oxford, UK


P07 Advanced Characterization of Energy-Related Materials

Meng Gu, Chongmin Wang, Katherine Jungjohann, Judith Yang

Energy-related materials are key to the sustainable development of modern society. This symposium covers the aspect of energy generation, capture, conversion, storage, and efficiency. The topics include but are not limited to materials for: batteries, solar energy, fuel cells, thermoelectrics, ferroelectrics, piezoelectrics, and catalysts. Characterization methods are rapidly developing that are providing heretofore new fundamental understanding of structure-property relationships. Microscopy and spectroscopy capabilities for studying energy materials has moved beyond the static imaging for structural and chemical analysis, into real-time operando studies. The use of electron microscopy for understanding growth, phase transformations, reaction and degradation mechanisms, and electron-beam induced processes for these materials highlights the key interest to the community and will develop strategies for future technologies. Contributions are welcome in areas relevant to energy-related materials — structure, property measurement, advanced characterization such as three-dimensional microscopy, EDS, EELS, in-situ environmental and external probing, as well as failure analysis for energy storage and conversion materials.

Invited Speakers:

  • Yuichi Ikuhara, University of Tokyo, Japan
  • Guangwen Zhou, State University of New York, Binghamton
  • Nigel Browning , Pacific Northwest National Laboratory
  • Shirley Meng, University of California, San Diego
  • Abhaya Datye, University of New Mexico
  • Haimei Zheng, Lawrence Berkeley National Laboratory
  • Ray Unocic , Oak Ridge National Laboratory
  • Zhiwei Shan, Xi'An Jiao Tong University, China
  • Jiangwei Wang, Zhejiang University, China


P08 Geological Sample Characterization using Various Imaging Modalities

Lori A Hathon, K. N. (Bobby) Hooghan, Michael J. Jercinovic, Bradley T. De Gregorio

This symposium is intended to be a forum for the exchange of information and knowledge regarding the combined use of multiple imaging and microanalysis tools for the characterization of geological samples. Invited papers would include those involving quantitative image interpretation, the integration of multiple imaging and microanalysis techniques for estimation of rock and mineral properties, innovative solutions to long standing technical challenges for imaging/analysis/sample preparation, and applications of machine learning (deep learning) using image data. Target attendees will include engineers and scientists from all levels of analytical expertise in geology-related backgrounds, including oil and gas industry, earth science, and planetary science.

Invited Speakers:

  • Kenneth Edgett, Malin Space Science Systems
  • Paul Hackley, U.S. Geological Survey
  • Patrick Smith, University of Texas, Austin
  • Christine Floss, Washington University
  • Thomas Sharp, Arizona State University


P09 Application of Advanced Characterization Methods to Examine Materials Used in Nuclear Power Systems

M. Grace Burke, Bryan D. Miller, Arthur T. Motta

Materials used in nuclear power systems are subjected to extreme environmental conditions that can strongly affect their performance over many years of plant operation. The focus of this symposium is how the application of advanced characterization methods can be used to examine materials-related issues common to nuclear power systems. A broad range of topics related to characterization of low alloy steels, austenitic stainless steel, Ni-Cr alloys, and zirconium are welcome for presentation at this symposium.

Invited Speakers:

  • Djamel Kaoumi, University of South Carolina
  • Jovan Lim, Culham Centre for Fusion Energy, UK
  • Gene Lucadamo, Naval Nuclear Laboratory
  • Emmanuelle Marquis, University of Michigan
  • Greg McMahon, University of Manchester, UK


P10 Diamonds: From the Origins of the Universe to Quantum Sensing in Materials and Biological Science Applications

Nestor J. Zaluzec

On this 75th Diamond Anniversary of the Microscopy Society of America we will revisit the microstructure and spectroscopy of diamonds as well as the development of the diamond knife as a tool in microscopy. Invited speakers will discuss topics that range from nano-diamonds and the origins of solar systems, color centers in native diamonds, engineered ultrananocrystalline diamond as layered coatings, excitonic defects in diamond for quantum computing, and sensors in bio-systems. Using Optical, Electron and Atom Probe techniques they will present current research using both imaging and associated spectroscopes to explore questions ranging from the micro to the nanoscale. Contributed papers on the use and characterization of diamonds in all its forms and at all scales in Materials and Life Sciences are welcome.

Invited Speakers:

  • Nick Wilson, CSIRO, Australia
  • Raul Arneal, University of Zaragoza, Spain
  • Philipp R. Heck, Fiedl Museum of Chicago
  • Jianguo Wen, Argonne Natonal Laboratory
  • Wofgang Jaeer, University of Kiel, Germany
  • Ettienne Minnaar, Nelson Mandela Metropolitan University, South Africa


Analytical Sciences Symposia


A01 Vendor Symposium

Paul Voyles, Esther Bullitt

This symposium is a forum for vendors to highlight advances in the development and improvement of their products. It covers new methods and technologies that advance the fields of microscopy and microanalysis for both physical and biological sciences, and provides a forum for exchange of ideas and best practices.


A02 Compressive Sensing, Machine Learning & Advanced Computation in Microscopy

Andrew Stevens, Rowan Leary, Volkan Ortalan

This symposium is concerned with the use of advanced statistical, mathematical, and computational methods, in microscopy and spectroscopy. Papers will focus on important topics in both machine learning and compressive sensing�especially their application to the acquisition and analysis of image, diffraction, and spectral data. The symposium will cover new microscope designs that depend on computational recovery techniques and other novel post facto machine learning and computational techniques for powerful analysis of microscope data. Our target audience is generic microscope users, to introduce new techniques to the community and facilitate communication leading to their adoption.

Invited Speakers:

  • Nigel Browning, Pacific Northwest National Laboratory
  • Michael Gehm, Duke University
  • Paul Midgely, Cambridge University, UK
  • Charles Bouman, Purdue University


A03 Big, Deep and Smart Data in Microscopy

Sergei V. Kalinin, Eric Stach

The symposium is intended to be the forum for scientists interested in opportunities offered by the rapidly developing technologies for data intensive computer imaging. It aims to cover the full knowledge generation cycle in imaging, starting from data stream capture in electron, probe, and optical microscopies, automatic image compression and storage, and compressed sensing technologies. Special attention will be devoted to physics-based multivariate methods for data analysis, combining the power of statistical methods with physical insights into the origins of the signal. We further welcome contributions on automatic image analytics, including extraction of physical order parameter fields and chemical phases, defect and phase boundary identification, and registration between multimedia images for direct structure-property relationship mapping and data mining. Finally, we welcome contributions concerning materials property extraction from static and dynamic imaging data as well as integration between materials genomics and experimental data analyses.

Invited Speakers:

  • Ichiro Takeuchi, University of Maryland
  • Colin Ophus, Lawrence Berkeley National Lab
  • Simon Billinge, Columbia University
  • Benji Maruyama, Air Force Research Laboratory, Wright Patterson AFB


A04 Advances in Programming of Quantitative Microscopy for Biological and Materials Science

Hendrix Demers, Philippe Pinard

Cutting-edge quantitative analyses do not only require state-of-the-art instruments but also innovative programs to collect and analyze data. The development of programs, scripts, and libraries opens the door to new applications of microanalysis, helps solve more challenging and important problems, and promotes the advancement of microscopy. This symposium aims to showcase programs written by microscopists for their particular biological and materials applications, to encourage the community to write or contribute to existing programs, and to promote collaborative work that will allow the development of new ideas and projects in microanalysis. Contribution in the following categories and related subjects are welcome.

Invited Speakers:

  • Nicholas Ritchie, National Institute of Standards and Technology
  • Francisco de la Pena, Cambridge University, UK
  • Ivan Bota, Antwerpen University, Belgium
  • Marc De Graef, Carnegie Mellon University


A05 Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Keana Scott, Nabil Bassim, Assel Aitkaliyeva

Focused ion beam instruments are now available with a widening choice of ions and with new applications involving both imaging and milling with ions. With recent advances in detector technology and analysis techniques, applications span the needs of the semiconductor industry, materials science, and biology. In this symposium, we encourage abstracts on all aspects of ion beam technology. Topics such as theoretical or experimental work on ion-solid interactions, FIB-based specimen preparation, processing and fabrication methods, FIB-based 2D and 3D analyses of hard and soft materials, novel data acquisition and processing methods, and practical data handling strategies are welcome. Advances in new instrumentation or methods such as light ion sources, high current ion sources, mass filtered ion sources or low energy ion milling are also of interest.

Invited Speakers:

  • Julia Mahamid, Max Planck Institute of Biochemistry, Germany
  • Peter Hosemann, University of California, Berkeley
  • Jebez McClelland, National Institute of Standards and Technology
  • Olga Ovchinnikovo, Oak Ridge National Laboratory


A06 Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy

Nikhilesh Chawla, James Evans, Arno P. Merkle

Multiscale imaging aids in the understanding of how changes at each scale of interaction impacts whole systems. For material science applications, this can mean linking the atomic scale to bulk material or engineering scales. Whereas in biology it means placing macromolecular complexes and other subcellular components into a whole cell context or localizing single cells in a larger community, plant or animal scale context. Although each sample may have different temporal and spatial requirements, a common need exists to create hierarchical volumetric imaging data with increasing resolution or field-of-view under both static and in situ conditions in order to observe structural evolution (e.g. 4D). This symposia will bring together leaders in both materials science and biological fields for bridging scales in 2D, 3D and 4D microscopy using a variety of modalities alongside appropriate quantitative analysis techniques.

Invited Speakers:

  • Manfred Auer, Lawrence Berkeley National Laboratory
  • Vincent de Andrade, Argonne National Laboratory
  • Ken Kemner, Argonne National Laboratory
  • Peter Voorhees, Northwestern University


A07 Materials Characterization Using Atomic-scale EDX/EELS Spectroscopy

Ping Lu, Jian-Min Zuo, Mark Oxley

Advances in atomic-scale chemical imaging using EDX and/or EELS signals in STEM/TEM provide an unprecedented opportunity for materials characterization. Chemical structures of crystal lattices and defects can be directly imaged in principle at atomic-scale in real space under proper imaging conditions. Such information greatly facilitates understanding of materials� physical properties. However, because of the strong electron interaction with solids and the technical challenges in data collection and interpretation, quantitative analyses as well as the types of materials problems can be addressed by atomic-scale chemical imaging are still challenging and further development requires concerted experimental and theoretical efforts. This symposium will address the latest development and technical advances in the field, and in particular highlight recent applications of the techniques in resolving structures of crystals, thin films, interfaces, and defects in various materials systems including metals, oxides and semiconductors, and developments in quantification methods as well as advanced theoretical models.

Invited Speakers:

  • Quentin Ramasse, SuperSTEM, UK
  • Masashi Watanabe, Lehigh University
  • Gianluigi Botton, MacMaster University, Canada
  • Scott Findlay, Monash University, Australia
  • Matt Chisholm, Oak Ridge National Laboratory
  • Maria Varela, University Complutense of Madrid, Spain
  • Lin Zhou, Ames Lab


A08 Advances and Applications of Aberration-Corrected Electron Microscopy

David Muller, David Smith

The major objective of this symposium is to provide an overview of recent advances and applications of aberration-corrected TEMs and aberration-corrected STEMs, in particular to illustrate the wide diversity of materials that are being studied and problems that are being solved using these instruments. Topics of special interest will include novel imaging and detector modes that are enabled by correctors, resolution and dose limits including AC-cryoEM, data acquisition and image artifacts, and approaches for extracting quantitative information about atomic locations and identity in 3-D environments.

Invited Speakers:

  • Jim Ciston, Lawrence Berkeley National Laboratory
  • Lena Kourkoutis-Fitting, Cornell University
  • Jannik Meyer, University of Vienna, Austria
  • Ben McMorran, University of Oregon
  • Kazu Suenaga, AIST, Japan
  • Paul Voyles, University of Wisconsin, Madison


A09 Standards, Reference Materials, and their Applications in Quantitative Microanalysis

Julien Allaz, Anette von der Handt, Owen Neill

Standards and reference materials are essential for obtaining accurate quantitative compositional data from X-ray microanalysis by EPMA or SEM (WDS/EDS), as well as from other microanalytical techniques (LA-ICP-MS, SIMS, �-XRF, FTIR, Raman spectroscopy, etc.). These materials must be rigorously evaluated for their reference compositions and homogeneity, must be widely available to the analytical community, and must be properly maintained to avoid contamination or deterioration. We welcome contributions on the synthesis, evaluation, distribution, and maintenance of standards and reference materials, as well as their appropriate use in microanalysis. We further encourage submissions on standard-based applications of quantitative microanalysis, or on the development of new quantitative microanalytical protocols.

Invited Speakers:

  • John Hanchar, Memorial University, Canada
  • Will Nachlas, Syracuse University
  • Tim Rose, Smithsonian Institution
  • Steve Wilson, United States Geological Survey


A10 Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects

Robert Keller, Raynauld Gauvin, Shirin Kaboli

This symposium presents recent advances in two growing realms of methods that extend established limits of conventional SEM characterization. Transmission techniques for diffraction, imaging, and spectroscopy in the SEM are seeing rapid adoption in varied areas such as nanocrystalline materials, nanoparticles, corrosion, highly-deformed materials, geology, and biology. Electron channeling plays an important role in contrast mechanisms for imaging of grain substructures, defects, strain fields, and magnetic domains in materials. While these characterization realms tend to see separate development in terms of instrumentation and applications, they share many aspects of electron scattering theory. Channeling phenomena will also affect data collected by transmission techniques. We seek contributions addressing contrast mechanisms, instrumentation, improvements in resolution, and novel problems solved by transmission techniques and channeling methods in any class of materials. Target attendees include scientists, engineers, and laboratory technicians working in materials science, metallurgy, nanotechnology, geology, and biology.

Invited Speakers:

  • Patrick Trimby, University of Sydney, Australia
  • Jason Holm, National Institute of Standards and Technology
  • John Mendenhall, University of Texas, Austin
  • Joseph Michael, Sandia National Laboratories
  • David Bell, Harvard University
  • Hendrix Demers, McGill University
  • Stefan Zaefferer, Max Planck Institute for Iron Research, Germany
  • Angus Wilkinson, University of Oxford
  • Martin Crimp, Michigan State University


A11 Instrumentation of Atom Probe: 50 Years and Counting

Ross Marceau, Prakash Kolli, Thomas Kelly
*Featured Invited Speaker: John Panitz, Emeritus Professor of Physics, University of New Mexico

The year 2017 marks the 50th anniversary of atom probe. The technique has a rich history from its origin with field ion microscopy as a precursor, through the evolution of many advancements, to the recent flourishing of its most prominent form, atom probe tomography (APT). The proliferation of APT has continued with its impact upon an increasingly broad range of materials research. The aim of this symposium is twofold: to capture and showcase some of the key historical breakthroughs that underpin the technique to this day, noting their associated impacts on scientific research; and to highlight ongoing research at the cutting edge of APT instrumentation and technique development. Contributions are welcome from both these areas. Please also see below for suggested topics of interest.

Invited Speakers:

  • John Panitz, University of New Mexico
  • Douglas Barofsky, Oregon State University
  • Gary Kellogg, retired (formerly with Sandia National Laboratories)
  • Ty Prosa, Cameca Instruments


A12 Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography

Baptiste Gault, Arun Deveraj, David J. Larson

This symposium is part of the event organized for the 50th anniversary of the atom probe, and will focus on the methods used to treat raw data, in order to build the point-cloud that constitutes the tomographic reconstruction, as well as the methods applied to the point cloud to extract information regarding the presence of secondary phases, atomic clusters, or local structure (e.g. atomic planes). Another aspect that will be covered are numerical simulations of the field evaporation process which underpins atom probe tomography, and which enable to gain a better understanding of the fundamental aspects of the technique, including the image formation and some of the artifacts commonly affecting the data. Target attendees will include scientists and engineers from all levels with an interest in atom probe tomography.

Invited Speakers:

  • Francois Vurpillot, Université de Rouen, France
  • Jon Hyde, National Nuclear Laboratory, UK
  • Brian Geiser, Cameca Instruments


A13 Applications of Atom Probe Tomography

Michael Moody, Mattias Thuvander, Didier Blavette

Atom probe tomography (APT) continues to be adapted for the atomic-scale characterisation of an increasingly diverse range of materials and devices. APT underpins research into a wide variety of alloys and semiconductors, and more recently, the analysis of materials previously considered too exotic for APT, such as minerals, bio-materials and large band gap insulators. Furthermore, APT is playing an increasingly important role in device failure-analysis, and in understanding in-service degradation of microstructure of materials subject to, for example, elevated temperatures, nuclear irradiation or corrosive conditions. All contributions featuring research enabled by APT, and in particular the development of APT for new applications, are welcome.

Invited Speakers:

  • Rachel Oliver, Cambridge University, UK
  • Paul Koenraad, Eindhoven University of Technology, Netherlands
  • Taisuke Sasaki, National Institute for Materials Science, Japan


A14 Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques

Sanjit Bhowmick, Andrew Minor, Daniel Kiener, Nan Li

Nanomechanical testing inside an electron microscope provides an opportunity for real-time imaging of the dynamics of deformation in materials at the micrometer, nanometer, and atomic scale. Recent advances in microscopy techniques, analytical detectors, high-speed cameras, and computing resources are able to provide unprecedented insights and fundamental understanding of elasticity, plasticity, fatigue, and fracture in nanostructured materials. The focus of this symposium is to bring the growing in-situ mechanical characterization community together to discuss key developments in techniques and experimental methods that aid in the understanding of deformation mechanisms of small-scale materials. Contributions on advanced mechanical characterization in controlled environments, which include elevated temperature, cryogenic temperature, electrical and magnetic fields, gas, and humidity, are particularly welcome.

Invited Speakers:

  • Gerhard Dehm, Max-Planck-Institut für Eisenforschung GmbH, Germany
  • Peter Hosemann, University of California, Berkeley
  • Amit Misra, University of Michigan
  • Mitra Taheri, Drexel University
  • Christian Kübel, Karlsruhe Institute of Technology
  • Christian Rentenberger, University of Vienna, Austria
  • Khalid Hattar, Sandia National Laboratories
  • Tevis Jacobs, University of Pittsburgh
  • Josh Kacher, Georgia Tech
  • Chen Youxing, Los Alamos National Laboratory


A15 Pushing the Limits of Cryo-TEM: Development and Applications

Mike Marko, Radostin Danev

Cryo-EM is attracting great interest now that technological advances are facilitating single-particle maps with resolution in the 3� range, and sub-tomogram-averaged maps in the 1 nm range, all with the sample in a near-native, hydrated state. This symposium will highlight technology and applications, with invited speakers who are key to the latest developments, and will include contributed papers from participants in this exciting field.

Invited Speakers:

  • Robert Glaeser, Lawrence Berkeley National Lab
  • Paul Mooney, Gatan
  • Yifan Cheng, University of California - San Francisco
  • Stephan Pfeffer, Max Planck Institute for Biochemistry, Germany
  • Steven Ludtke, Baylor College of Medicine
  • Anchi Cheng, New York Structural Biology Center
  • Muyuan Chen, Baylor College of Medicine
  • Lingbo Yu, Thermo Fisher
  • Michael Elbaum, Weizman Institute of Science
  • Katherine Spoth, Cornell University


A16 In situ and operando Characterization of Material Processes in Liquids and Gases

Raymond Unocic, Guangwen Zhou, Libor Kovarik

Within the past few years, in situ and operando electron microscopy has evolved to the point where high spatial and temporal resolution imaging, diffraction, and spectroscopy can be performed to elucidate the behavior of materials within liquid and gaseous environments either in response to external stimuli (in situ) or under a working condition (operando). This symposium intends to focus on the development of advanced techniques for in situ/operando experimentation and utilization of such techniques to study fundamental materials structure and chemistry, functional properties, dynamical behavior under non-equilibrium conditions, and materials synthesis/degradation. Understanding the effect of sample-beam interactions, which often limits the applicability of in situ TEM techniques, will also be of interest in this symposium. The symposium will focus on all aspects of imaging and analysis, covering imaging, diffraction and chemical analysis approaches available though in situ TEM.

Invited Speakers:

  • Eric Stach, Brookhaven National Laboratory
  • Thomas Hansen, Technical University of Denmark, Denmark
  • Ai Leen Koh, Stanford University
  • Haimei, Zheng, Lawrence Berkeley National Laboratory
  • Taylor Woehl, University of Maryland
  • Katherine Jungjohann, Sandia National Laboratory
  • Nan Jiang, Arizona State University


A17 Biological Soft X-ray Tomography

Carolyn Larabell, Kenneth Fahy

This symposium is a forum for the exchange of information and knowledge on the use of soft X-ray tomography for imaging biological specimens. Soft X-ray tomography images fully hydrated, intact cells in 3D without the use of contrast agents or other visualization enabling molecules. Invited papers would include those describing technical advances in specimen preparation, data processing and reconstruction, imaging formation theory, and novel applications of the soft X-ray tomography in cell science. Target audience will include cell biologists, and scientists and engineers interested in novel microscopies, including correlative imaging methods.

Invited Speakers:

  • Lucy Collinson, The Francis Crick Institute, UK
  • Gerry McDermott, University of California, San Francisco
  • Emily Sontag, Stanford University


A18 Celebrating 50 Years of Microanalysis

Paul Carpenter, Edward Vicenzi, Julie Chouinard

We celebrate 50 years of microanalysis with a perspective of past, present, and future scientific accomplishments, and the evolution of MAS over half a century. To mark this golden anniversary, invited and contributed papers will be solicited regarding: the history and development of quantitative microanalysis, current microanalysis challenges, and especially important developments for the future of our discipline. We encourage submissions including EPMA, SEM, WDS, EDS, STEM, EELS, correction algorithms, data processing and visualization, cathodoluminescence, micro-XRF spectrometry, and historical and educational aspects of MAS.

Invited Speakers:

  • Miriam Hebert, University of Maryland
  • George Havrilla, Los Alamos National Laboratories
  • Nick Wilson, CSIRO Australia
  • Colin McRae, CSIRO Australia
  • Amy Walker, University of Texas - Dallas
  • Brad Jolliff, Washington University
  • Andrew Herzing, National Institute of Standards and Technology
  • Ondrej Krivanek, NION Company
  • Thomas Kelly, Ametek


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